Manager, Product and Test Engineering

7 giorni fa

Province of Monza and Brianza, Lombardy, Italia Allegro Microsystems Tempo pieno

Overview

In this role you lead a high-performing Test Engineering team in Milan, owning test strategy, silicon validation, and transition to production for high-voltage semiconductor products. You will drive DFT collaboration, ATE hardware/software development, and product characterization to ensure quality and manufacturability. You will influence cross-functional teams and global manufacturing partners to optimize yields and reliability in a fast-paced, automotive-focused environment. This is a hands-on leadership role with a direct impact on product release quality and operational excellence.

Retribuzione / Benefits

  • Total Rewards package
  • base salary plus bonus
  • local market alignment
  • competitive compensation
  • career development
  • annual review tied to performance

Responsabilità

  • Lead and grow a team of Test Development and Product Engineers
  • Define and implement wafer probe and final packaged test strategies for high-voltage ICs
  • Oversee ATE load boards, probe cards, and test programs using Teradyne ETS/Eagle 364 or similar
  • Collaborate with IC Design and Systems Engineering to define DFT methods (digital scan, Iddq, SHOVE, GateStress)
  • Drive Silicon Review and full electrical characterization across temperature and process corners
  • Ensure smooth Pre-Production Release to Release to Production per automotive/industrial standards
  • Partner with global manufacturing and foundry teams to monitor yields and drive yield improvements

Requisiti fondamentali

  • 8+ years in semiconductor Test Engineering
  • Experience leading or supervising engineering teams
  • Strong background in analog, mixed-signal, or high-voltage power IC testing
  • Strategic communicator
  • Collaborative builder across geographies and functions
  • Problem solver with analytical mindset
  • ATE test program development
  • Hardware design for test boards (schematics, PCB layout)
  • High-voltage testing challenges (isolation barriers, partial discharge, transient measurements)